Plant elemental composition and portable X-rayfluore scence (pXRF) spectroscopy:quantification under differentanalytical parameters

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cg.contributor.crpWater, Land and Ecosystemsen_US
cg.identifier.doihttps://doi.org/10.1002/xrs.2678en_US
cg.identifier.wlethemeDecision Analysis and Informationen_US
cg.issn0049-8246en_US
cg.issn1097-4539en_US
cg.issue2en_US
cg.journalX-Ray Spectrometryen_US
cg.volume45en_US
dc.contributor.authorTowett, Erick K.en_US
dc.contributor.authorShepherd, Keith D.en_US
dc.contributor.authorDrake, B. Leeen_US
dc.date.accessioned2016-09-20T04:31:52Zen_US
dc.date.available2016-09-20T04:31:52Zen_US
dc.identifier.urihttps://hdl.handle.net/10568/77075en_US
dc.titlePlant elemental composition and portable X-rayfluore scence (pXRF) spectroscopy:quantification under differentanalytical parametersen_US
dcterms.abstractEmergence of portable X-ray fluorescence (pXRF) systems presents new opportunities for rapid, low-cost plant analysis, both as a lab system and in situ system. Numerous studies have extolled the virtues of using pXRF for a wide range of plant applications, however, for many such applications, there is need for further assessment with regards to analytical parameters for plant analysis. While pXRF is a potential powerful research tool for elemental composition analysis, its successful use in plant analysis is made more likely by having an understanding of X-ray physics, calibration process, and ability to test a variety of homogenous and well-characterized materials for developing a matrix-specific calibration. Because potential pXRF users may often underestimate the complexity of proper analysis, this study aims at providing a technical background for plant analysis using pXRF. The focus is on elemental quantification under different analytical parameters and different methods of sample presentation: direct surface contact under vacuum, placement in a sample cup with prolene as a seal, and without the aid of a vacuum. Direct analysis on the surface of a pXRF provided highest sensitivity and accuracy (R2 > 0.90) for light elements (Mg to P). Sulfur, K, and Ca can be reliably measured without the aid of a vacuum (R2 > 0.99, 0.97, and 0.93 respectively), although lower detection limits may be compromised. pXRF instruments provide plant data of sufficient accuracy for many applications and will reduce the overall time and budget compared with the use of conventional techniques. Sensitivity and accuracy are dependent on the instrument's settings, make, and model. © 2015 The Authors. X-Ray Spectrometry published by John Wiley & Sons, Ltd.en_US
dcterms.accessRightsOpen Accessen_US
dcterms.available2015-12-07en_US
dcterms.bibliographicCitationTowett, Erick K.;Shepherd, Keith D.;Drake, B. Lee.2015.Plant elemental composition and portable X-rayfluore scence (pXRF) spectroscopy:quantification under differentanalytical parameters.Colombo:Sri Lanka.International Water Management Institute (IWMI). CGIAR Research Program on Water, Land and Ecosystems (WLE).8p. 10.1002/xrs.2678en_US
dcterms.extentpp. 117-124en_US
dcterms.issued2016-03en_US
dcterms.languageenen_US
dcterms.licenseCC-BY-NC-4.0en_US
dcterms.publisherWileyen_US
dcterms.subjectanalysisen_US
dcterms.subjectcompositionen_US
dcterms.subjectspectroscopyen_US
dcterms.typeJournal Articleen_US

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