Genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield

Juliana, PhilominXinyao HePoland, Jesse A.Shrestha, SandeshJoshi, Arun KumarHuerta Espino, JulioVelu, GovindanCrespo-Herrera, Leonardo A.Mondal, SuchismitaKumar, UttamBhati, PradeepVishwakarma, Manish KumarSingh, Ravi P.Singh, Pawan K.2023-01-042023-01-04https://hdl.handle.net/10568/126541Genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield